<?xml version="1.0" encoding="utf-8" ?>
- <Maps>
- <Map xmlns="http://www.semi.org" SubstrateId="695823901F1" SubstrateType="Wafer" FormatRevision="SEMI G85-0703">
- <Device Rows="36" LotId="6958239.013" BinType="ASCII" Columns="38" MapType="Array" NullBin="0" ProductId="K25A" WaferSize="200" CreateDate="20091106130620353" DeviceSizeX="5082.95000" DeviceSizeY="5262.95000" Orientation="0" SupplierName="Micron Technology, Inc." OriginLocation="2" MicronLotId="6958239.013">
<ReferenceDevice ReferenceDeviceX="27" ReferenceDeviceY="35" />
<Bin BinCode="G" BinCount="906" BinQuality="Pass" />
<Bin BinCode="X" BinCount="170" BinQuality="Fail" />
- <Data>
- <Row>
- <![CDATA[ 00000000000000XXGXGGGGXX00000000000000
]]>
</Row>
- <Row>
- <![CDATA[ 00000XXGGGGGGGGGGGGGGGGGGGGXXGGGX00000
]]>
</Row>
- <Row>
- <![CDATA[ 000000XXGGGGGGGGXGXGGGGGGGGGGGXX000000
]]>
</Row>
-
如何对xml内容数据进行比较
例如：
<?xml version='1.0' encoding='utf-8'?>
<TestLIST>
<PID>40</PID>
<TestName>深圳市</TestName>
......
